Inspect What the Eye Can’t See — PCB & Electronics Quality with X-ray and CT

Home / Inspect What the Eye Can’t See — PCB & Electronics Quality with X-ray and CT

Industry Overview

Electronics manufacturing is shifting toward higher density, smaller packages, and faster production cycles; making hidden defects more likely and more costly. Failures caused by voiding, bridging, head-in-pillow, lifted leads, and insufficient solder fill often pass visual inspection but can lead to early field returns.

That’s why Non-Destructive Testing (NDT)—especially X-ray and CT—is critical for electronics quality. It enables manufacturers to inspect internal solder joints, verify connectivity, detect void patterns, and confirm process stability without damaging the PCB.

What Electronics QA Teams Struggle With

Hidden solder defects (BGA/QFN voids, cracks, bridging)

Component miniaturization (01005, fine pitch packages)

Higher rework cost (rework damages boards, time-consuming)

Yield loss & escapes (field failures hurt credibility)

Inventory accuracy (reel counts impact planning and line stoppages)

Traceability (need reports for OEM/customer compliance)

Product Highlights

SMT Line Process
1
2
3
4
1

MQX.gINti – AI X-ray Component Counter

Fast, accurate reel counting (even 01005) to prevent inventory mismatch, line stoppages, and planning errors.

CTA: View MQX.gINti / Contact Us

2

MQX.tracE – 2.5D PCB X-ray Inspection

Detect hidden solder defects like BGA voids, bridging, head-in-pillow indicators, and PTH fill issues without damaging the PCB.

CTA: View MQX.tracE / Download Brochure

3

MQX.tracE CT – 3D CT Slicing & Reconstruction

Move beyond 2D ambiguity. CT separates overlaps and confirms root cause with layer-by-layer slices and volumetric reconstruction.

CTA: View MQX.tracE CT / Request Demo

4

MQS Microfocus CT – Sub-micron CT for Advanced Electronics

For package-level analysis and micro-defect detection where standard X-ray is not enough—layer-by-layer CT slices for void morphology, cracks, delamination, and internal connectivity validation.

Resources for Electronics Inspection

PDF

MQX.tracE 2.5D Brochure

PCB X-ray inspection system overview

Download Now
PDF

MQX.tracE CT Brochure

3D CT slicing and defect validation

Download Now
PDF

Microfocus CT / Microfocus X-ray Brochure

Sub-micron imaging for advanced electronics R&D and deep failure analysis

Download Now
PDF

MQX.gINti Flyer

AI X-ray component counter for SMT reels

Download Now